I have a custom probe that is a chisel tipped stylus from a contour tracer configured to be mountable on a scanning probe head. My question is how can I go about trying to qualify this tip. I am sure I may have to make some manual entry adjustments. I am intending to only trace with it in 2D so radius comp and X,Y,Z offset is what I am looking for if I can get it. Any thoughts on how I might go about this would be appreciated.
For the measurement of contours we can use spherical or conical tips (conical tips with spherical end) and minimum radius of 0.075 mm. Spherical tips – Standard radius min: 0.15 mm Contour measurement tips (tip R0.075 for internal features ) No special calibration is needed. We are using standard spherical tip calibration. This ensures absolute correlation among all the tips on the CMM. For the calibration a small calibration artefact is to be used (5 to 8 mm) we can use another tip as calibration sphere. To evaluate the results we refer to the same parameters as for the standard tips – StdDev and PrbRdv.
The measurement is to be done with continuous unknown scan with a speed between 0.5 to 3 mm/s according to the contour radiuses. The point density can be kept on 100-200 pts/mm. The scan offset force is to be kept around a 0.06N (sensors X1C / X1H).
I wonder if the offset force can be reduced to .03N. I doubt it would be much of a difference, but our contour machine uses that force and it still leaves a slight line on the part after a trace.
I wonder if the offset force can be reduced to .03N. I doubt it would be much of a difference, but our contour machine uses that force and it still leaves a slight line on the part after a trace.
