I have a custom probe that is a chisel tipped stylus from a contour tracer configured to be mountable on a scanning probe head. My question is how can I go about trying to qualify this tip. I am sure I may have to make some manual entry adjustments. I am intending to only trace with it in 2D so radius comp and X,Y,Z offset is what I am looking for if I can get it. Any thoughts on how I might go about this would be appreciated.
its very interesting, can you show photos of your stylus ?
i was doing the same mad things on another software in previous work it was really fun three days while there was no much work to be done. Ended with some quite nice results in tests but had to finish the project quickly . My goal was to measure some radius faster on CMM with easier acces and not play with this boring form tracer with its problematic software (...)
its very interesting, can you show photos of your stylus ?
i was doing the same mad things on another software in previous work it was really fun three days while there was no much work to be done. Ended with some quite nice results in tests but had to finish the project quickly . My goal was to measure some radius faster on CMM with easier acces and not play with this boring form tracer with its problematic software (...)
I will get you the picture when I get in tomorrow. I never finished this project. PC-DMIS is not as friendly editing the correction of offsets as other software I have used.
