OPTIV M DualScan i+
OPTIV M DualScan i+

All-in-one metrology solution with two independent sensor axes

OPTIV M DualScan i+ offers measurement time improvements for an extended range of complex precision parts by deploying automatically exchangeable sensors in conjunction with an indexing probe head. This system guarantees optimum feature accessibility for large or heavy parts that must remain stationary within the measuring volume.

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