I have a custom probe that is a chisel tipped stylus from a contour tracer configured to be mountable on a scanning probe head. My question is how can I go about trying to qualify this tip. I am sure I may have to make some manual entry adjustments. I am intending to only trace with it in 2D so radius comp and X,Y,Z offset is what I am looking for if I can get it. Any thoughts on how I might go about this would be appreciated.
I'm not sure you can do it, but maybe someone else here can help. Most of the tips you describe that I've seen have a fairly small radius (.003in) and is basically in one axis. It's not a spherical tip. Unless PC dmis allows to calibrate a tip using a cylindrical standard, I'm not sure how that would work.
It's an interesting challenge though, so i might give it a shot.
I'm not sure you can do it, but maybe someone else here can help. Most of the tips you describe that I've seen have a fairly small radius (.003in) and is basically in one axis. It's not a spherical tip. Unless PC dmis allows to calibrate a tip using a cylindrical standard, I'm not sure how that would work.
It's an interesting challenge though, so i might give it a shot.
