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Tapered Oval Measurement Difficulties

I am attempting to measure an internal surface on an old injection mold cavity. The shape of the internal surface is oval at the z zero surface of the part, it is centered on the x y zero of the part and is tapered at +3.5 degrees per side as you descend in the z negative direction down through the part. My measurement strategy so far has been to rotate the CMM wrist to A15B0, take two hits at x zero, B zero z-10 and z-25, create a line through those two points and then create a point by projecting the line to the z zero surface. This method gives me a point that is not compromised by the damage that exists around the edge of the tapered cone and the z zero surface. I would then like to pattern this procedure around the oval at 15 degree intervals as measured normal to the drive curve to generate more points. This is where my lack of knowledge kicks in. If I define the pattern using "Alignment" I can define the angular range, as well as the step but the angle is measured from the x y zero of the part and the distance from x y zero does not change with the angular progression around the oval so that does not work. If I define the pattern using "Curve" I can define the step but it is a distance increment, not an angular increment and the problem I run into is it designates B angles that are not available in my probe definition and makes the data more cumbersome for us to use when we update our CAD file. Is there a way to make the pattern follow the curve at specific angles normal to the surface? Any suggestions from those more knowledgeable than I are very welcome.

Thanks in advance, Glenn

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